Built-In Self Test in VLSI: Ensuring Quality

Built in self test in vlsi

Built-in self-test is a design technique embedded within VLSI circuits that allows them to test themselves for various types of faults and potential malfunctioning. This means the chip doesn’t require external equipment or complex procedures to identify issues. BIST essentially equips the chip with its diagnostic toolkit. BIST Techniques in VLSI Logic BIST Logic BIST […]

Design for testability vs. functional verification

Design for testability

In the ever-evolving semiconductors landscape, DFT and functional verification have a huge role to play in ensuring the quality and reliability of hardware and software systems. They offer a high rate of defect detection leading to fewer faulty chips and increased confidence in the design’s functionality and performance.

Role of DFT in the Chip Life Cycle


According to a report by MMR, the VLSI semiconductor industry was worth US$ 53.93 billion in 2022, and total VLSI revenue is expected to grow at a rate of 6.0% CAGR from 2023 to 2029, reaching almost US$ 81.09 billion in 2029. While catering to such a massive market it is imperative to run specialized […]

DFT in VLSI- All You Need To Know

VLSI is the most coveted industry with numerous job opportunities for today’s generation. Every company is looking for VLSI engineers to excel in the market. DFT in VLSI stands for Design For Testability.  But with all the technological advancement, the chances of faults and drawbacks have also increased. Therefore design for testability (DFT) enters the […]

The Stuck-at Fault Model: Key Concept in Digital Circuit Testing

Understanding the Stuck-at Fault Model: A Key Concept in Digital Circuit Testing In the realm of digital circuit design and testing, the detection and diagnosis of faults play a crucial role in ensuring the reliability and functionality of electronic systems. One widely used fault model in this domain is the Stuck-at Fault Model.  This model […]

Fault Simulation: Unveiling the Secrets of System Reliability

In the world of complex electronic systems, reliability is paramount. Whether it’s a spacecraft hurtling through space, a critical infrastructure network, or a consumer device, ensuring that these systems function correctly is of utmost importance. One crucial tool in the pursuit of system reliability is fault simulation. This allows engineers to predict and analyze the […]

Enhancing Security and Efficiency: The Significance of Check points

In an era marked by rapid advancements and emerging challenges, the significance of security has reached unprecedented levels. From airports and borders to organizational settings, the imperative to prioritize safety measures and thwart unauthorized access has become a pressing need. One essential tool in this endeavor is the use of check points. These designated control […]

Bridging Fault Model: Understanding and Mitigating Circuit Failures

In the realm of digital circuit design, the reliable and accurate functioning of integrated circuits (ICs) is of utmost importance. Any faults or errors in these circuits can lead to undesirable consequences, ranging from system malfunctions to severe financial losses. One common type of fault that can occur in ICs is known as a bridging […]

At Speed Testing: Ensuring Reliability in High-Speed Electronics

Today’s Chip designs are becoming smaller. Feature sizes are shrinking towards nano scale geometries, while gate counts are approaching 100M. Semiconductor companies developing these nanoscale devices are dealing with a slew of challenges caused by this smaller yet increasingly complicated design environment. One problem that is becoming increasingly important is the development of high-quality, low-cost […]

The Importance of LBIST: Enhancing Testability in Semiconductor Design

In the present-day scenario, the design complexity and size of the SOC are expanding at an alarming rate. Designers are likewise shifting to lower technology nodes in order to meet greater performance goals. There may be flaws that arise during the device’s field usage. Infield failures are mostly caused by latent flaws, which may not […]

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