The Importance of LBIST: Enhancing Testability in Semiconductor Design

In the present-day scenario, the design complexity and size of the SOC are expanding at an alarming rate. Designers are likewise shifting to lower technology nodes in order to meet greater performance goals. There may be flaws that arise during the device’s field usage. Infield failures are mostly caused by latent flaws, which may not […]

Fault Collapsing in VLSI: Enhancing Reliability and Efficiency

In the world of Very Large Scale Integration, where intricate electronic systems are integrated onto a single chip, ensuring reliability and efficiency is very crucial. However, VLSI circuits are susceptible to faults that can disrupt their functionality, leading to errors and malfunctions. To address this challenge, engineers and researchers have developed techniques such as fault […]

On-chip Clock Controller: Enhancing Clock Control for Integrated Circuits

OCC refers to component or module that manages and controls the clock signals within an integrated circuit (IC) for the purpose of testing.The OCC is responsible for generating and distributing clock signals to different parts of the IC during test operations.An on-chip clock controller is an essential component in modern digital systems. It is responsible […]

Optimizing VLSI Design With D-Algorithm

D-algorithm is a powerful optimization technique used in VLSI design to reduce the size of circuits and improve their performance. It is a popular method for logic synthesis and optimization and is widely used in the semiconductor industry. The D-algorithm is based on the concept of don’t care conditions,these are the conditions in a logic […]

Unleashing The Power Of JTAG In Digital Circuits

JTAG or Joint Test Action Group was developed in the 1980s as a way to improve the testing and debugging of digital circuits. Before JTAG, the process of testing and debugging integrated circuits was time-consuming and expensive. JTAG simplified the process by providing a standardized way to access and control the internal components of an […]

Burn-in Test: Everything You Need To Know

In the field of VLSI, the burn-in test is an essential and critical process used to identify any potential defects or weaknesses in integrated circuits (ICs) before they are shipped to customers. The burn-in test ensures that the ICs can withstand extended periods of operation without failure, especially under high-stress conditions such as high temperature […]

Streamlining Electronics Testing with Automatic Test Equipment

Automatic Test Equipment (ATE) is an essential tool for the modern manufacturing industry. It is a device that performs automated testing of electronic components, circuits, and systems to ensure their quality and performance.ATE is an essential component of DFT because it enables the testing of electronic devices and systems using software-controlled test procedures. By incorporating […]

MBIST in VLSI: Ensuring Better Quality Chips

In modern SoCs, embedded memory takes up the majority of the chip space and incorporates an even greater number of active devices. Because memories are meant to be exceedingly dense to the limitations of technology, faults may occur. Moreover, when fault types become more complex and diversified, they may escape detection during testing. Memory test […]

A Comprehensive Overview of BIST In VLSI

BIST is a DFT approach that involves inserting additional hardware capabilities into integrated circuits to allow them to undertake self-testing, lowering reliance on an external ATE and hence reducing testing expense. The BIST principle may be used for almost any type of circuit. BIST is also a solution for testing circuits that do not have […]

DFT Scan Types And Their Mechanism

As Design Complexity increases, there are a number of challenges such as higher test costs, higher power consumption, pin count, and new defects at small geometries. So, as VLSI technology shrinks to lower technology nodes, we need efficient techniques for testing on lower nodes. Both reliability and testability are critical criteria in today’s VLSI design. […]

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