Bridging Fault Model: Understanding and Mitigating Circuit Failures
In the realm of digital circuit design, the reliable and accurate functioning of integrated circuits (ICs) is of utmost importance. Any faults or errors in these circuits can lead to undesirable consequences, ranging from system malfunctions to severe financial losses. One common type of fault that can occur in ICs is known as a bridging […]
At Speed Testing: Ensuring Reliability in High-Speed Electronics
Today’s Chip designs are becoming smaller. Feature sizes are shrinking towards nano scale geometries, while gate counts are approaching 100M. Semiconductor companies developing these nanoscale devices are dealing with a slew of challenges caused by this smaller yet increasingly complicated design environment. One problem that is becoming increasingly important is the development of high-quality, low-cost […]
The Importance of LBIST: Enhancing Testability in Semiconductor Design
In the present-day scenario, the design complexity and size of the SOC are expanding at an alarming rate. Designers are likewise shifting to lower technology nodes in order to meet greater performance goals. There may be flaws that arise during the device’s field usage. Infield failures are mostly caused by latent flaws, which may not […]
Fault Collapsing in VLSI: Enhancing Reliability and Efficiency
In the world of Very Large Scale Integration, where intricate electronic systems are integrated onto a single chip, ensuring reliability and efficiency is very crucial. However, VLSI circuits are susceptible to faults that can disrupt their functionality, leading to errors and malfunctions. To address this challenge, engineers and researchers have developed techniques such as fault […]
On-chip Clock Controller: Enhancing Clock Control for Integrated Circuits
OCC refers to component or module that manages and controls the clock signals within an integrated circuit (IC) for the purpose of testing.The OCC is responsible for generating and distributing clock signals to different parts of the IC during test operations.An on-chip clock controller is an essential component in modern digital systems. It is responsible […]
Optimizing VLSI Design With D-Algorithm
D-algorithm is a powerful optimization technique used in VLSI design to reduce the size of circuits and improve their performance. It is a popular method for logic synthesis and optimization and is widely used in the semiconductor industry. The D-algorithm is based on the concept of don’t care conditions,these are the conditions in a logic […]
Unleashing The Power Of JTAG In Digital Circuits
JTAG or Joint Test Action Group was developed in the 1980s as a way to improve the testing and debugging of digital circuits. Before JTAG, the process of testing and debugging integrated circuits was time-consuming and expensive. JTAG simplified the process by providing a standardized way to access and control the internal components of an […]
Burn-in Test: Everything You Need To Know
In the field of VLSI, the burn-in test is an essential and critical process used to identify any potential defects or weaknesses in integrated circuits (ICs) before they are shipped to customers. The burn-in test ensures that the ICs can withstand extended periods of operation without failure, especially under high-stress conditions such as high temperature […]
Streamlining Electronics Testing with Automatic Test Equipment
Automatic Test Equipment (ATE) is an essential tool for the modern manufacturing industry. It is a device that performs automated testing of electronic components, circuits, and systems to ensure their quality and performance.ATE is an essential component of DFT because it enables the testing of electronic devices and systems using software-controlled test procedures. By incorporating […]
MBIST in VLSI: Ensuring Better Quality Chips
In modern SoCs, embedded memory takes up the majority of the chip space and incorporates an even greater number of active devices. Because memories are meant to be exceedingly dense to the limitations of technology, faults may occur. Moreover, when fault types become more complex and diversified, they may escape detection during testing. Memory test […]