A Quick Introduction To Lockup Latches In VLSI Designs
A vital component of scan-based devices is a lock-up latch. These are primarily used for shift mode hold time closing. […]
Design for Test
Design for Test
What is Design For Testability And Why Is It Important?
As advances in integrated circuit (IC) processing technology continue to minimize the feature size, more sophisticated chips are being planned,
General
Design Hierarchy In VLSI
The hierarchy approach, sometimes known as the “divide and conquer” strategy, is breaking a module down into smaller units and
Design for Test
ATPG in VLSI: A Brief Guide
The chip manufacturing process is complex and prone to flaws, which are referred to as faults. A fault is testable
Design Verification
All About The Advanced High-Performance Bus
Advanced High-performance Bus is a protocol that is dedicated to high-performance transfers, connecting internal and external memory and high-performance peripherals.
Design Verification
Brief Insight On Advanced Peripheral Bus
Advanced Peripheral Bus (APB) is a protocol of the Advanced Microcontroller Bus Architecture (AMBA) family. The most recent version of
Design Verification
An Overview On System Verilog Testbench
A system Verilog testbench is a container in which the design is placed and directed by various input stimuli. The
Physical Design
What is CRPR in VLSI?
Static timing analysis is critical in ensuring timing closure in current IC designs. Additional pessimism(a procedure to observe the wrong
Design for Test
What is Metastability in VLSI and How to Avoid it?
Metastability in VLSI is an unstable equilibrium occurrence in digital electronics in which the sequential element is unable to resolve
Design for Test
Electromigration in VLSI Physical Design: A Brief Guide
Electromigration in VLSI physical design is a major concern, particularly at lower technology nodes where the cross-sectional area of metal
