Temperature Inversion in VLSI: Impact on Performance and Reliability
Temperature inversion is a phenomenon that occurs in very large-scale integration circuits. In VLSI technology, transistors are used to build […]
Physical Design
Design for Test
Optimizing VLSI Design With D-Algorithm
D-algorithm is a powerful optimization technique used in VLSI design to reduce the size of circuits and improve their performance.
Design Verification
What is Advanced eXtensible Interface Protocol?
Advanced eXtensible Interface or AXI is an on-chip communication bus protocol. It was developed by ARM. It is described by
Design for Test
Unleashing The Power Of JTAG In Digital Circuits
JTAG or Joint Test Action Group was developed in the 1980s as a way to improve the testing and debugging
Design for Test
Burn-in Test: Everything You Need To Know
In the field of VLSI, the burn-in test is an essential and critical process used to identify any potential defects
Design for Test
Streamlining Electronics Testing with Automatic Test Equipment
Automatic Test Equipment (ATE) is an essential tool for the modern manufacturing industry. It is a device that performs automated
Design for Test
MBIST in VLSI: Ensuring Better Quality Chips
In modern SoCs, embedded memory takes up the majority of the chip space and incorporates an even greater number of
Design for Test
A Comprehensive Overview of BIST In VLSI
BIST is a DFT approach that involves inserting additional hardware capabilities into integrated circuits to allow them to undertake self-testing,
Design for Test
DFT Scan Types And Their Mechanism
As Design Complexity increases, there are a number of challenges such as higher test costs, higher power consumption, pin count,
Design for Test
A Quick Introduction To Lockup Latches In VLSI Designs
A vital component of scan-based devices is a lock-up latch. These are primarily used for shift mode hold time closing.
