Unleashing The Power Of JTAG In Digital Circuits
JTAG or Joint Test Action Group was developed in the 1980s as a way to improve the testing and debugging […]
Design for Test
Design for Test
Burn-in Test: Everything You Need To Know
In the field of VLSI, the burn-in test is an essential and critical process used to identify any potential defects
Design for Test
Streamlining Electronics Testing with Automatic Test Equipment
Automatic Test Equipment (ATE) is an essential tool for the modern manufacturing industry. It is a device that performs automated
Design for Test
MBIST in VLSI: Ensuring Better Quality Chips
In modern SoCs, embedded memory takes up the majority of the chip space and incorporates an even greater number of
Design for Test
A Comprehensive Overview of BIST In VLSI
BIST is a DFT approach that involves inserting additional hardware capabilities into integrated circuits to allow them to undertake self-testing,
Design for Test
DFT Scan Types And Their Mechanism
As Design Complexity increases, there are a number of challenges such as higher test costs, higher power consumption, pin count,
Design for Test
A Quick Introduction To Lockup Latches In VLSI Designs
A vital component of scan-based devices is a lock-up latch. These are primarily used for shift mode hold time closing.
Design for Test
What is Design For Testability And Why Is It Important?
As advances in integrated circuit (IC) processing technology continue to minimize the feature size, more sophisticated chips are being planned,
General
Design Hierarchy In VLSI
The hierarchy approach, sometimes known as the “divide and conquer” strategy, is breaking a module down into smaller units and
Design for Test
ATPG in VLSI: A Brief Guide
The chip manufacturing process is complex and prone to flaws, which are referred to as faults. A fault is testable
