What is an FPGA in VLSI?
What is an FPGA in VLSI? FPGA in VLSI stands for ‘Field Programmable Gate Array’, which is an integrated circuit […]
FPGA
Design for Test
Bridging Fault Model: Understanding and Mitigating Circuit Failures
In the realm of digital circuit design, the reliable and accurate functioning of integrated circuits (ICs) is of utmost importance.
At Speed Testing: Ensuring Reliability in High-Speed Electronics
Today’s Chip designs are becoming smaller. Feature sizes are shrinking towards nano scale geometries, while gate counts are approaching 100M.
The Importance of LBIST: Enhancing Testability in Semiconductor Design
In the present-day scenario, the design complexity and size of the SOC are expanding at an alarming rate. Designers are
Fault Collapsing in VLSI: Enhancing Reliability and Efficiency
In the world of Very Large Scale Integration, where intricate electronic systems are integrated onto a single chip, ensuring reliability
Design for Test
On-chip Clock Controller: Enhancing Clock Control for Integrated Circuits
OCC refers to component or module that manages and controls the clock signals within an integrated circuit (IC) for the
Physical Design
Temperature Inversion in VLSI: Impact on Performance and Reliability
Temperature inversion is a phenomenon that occurs in very large-scale integration circuits. In VLSI technology, transistors are used to build
Design for Test
Optimizing VLSI Design With D-Algorithm
D-algorithm is a powerful optimization technique used in VLSI design to reduce the size of circuits and improve their performance.
Design Verification
What is Advanced eXtensible Interface Protocol?
Advanced eXtensible Interface or AXI is an on-chip communication bus protocol. It was developed by ARM. It is described by
Design for Test
Unleashing The Power Of JTAG In Digital Circuits
JTAG or Joint Test Action Group was developed in the 1980s as a way to improve the testing and debugging
