MBIST in VLSI: Ensuring Better Quality Chips
In modern SoCs, embedded memory takes up the majority of the chip space and incorporates an even greater number of […]
Design for Test
Design for Test
A Comprehensive Overview of BIST In VLSI
BIST is a DFT approach that involves inserting additional hardware capabilities into integrated circuits to allow them to undertake self-testing,
Design for Test
DFT Scan Types And Their Mechanism
As Design Complexity increases, there are a number of challenges such as higher test costs, higher power consumption, pin count,
Design for Test
A Quick Introduction To Lockup Latches In VLSI Designs
A vital component of scan-based devices is a lock-up latch. These are primarily used for shift mode hold time closing.
Design for Test
What is Design For Testability And Why Is It Important?
As advances in integrated circuit (IC) processing technology continue to minimize the feature size, more sophisticated chips are being planned,
Design for Test
ATPG in VLSI: A Brief Guide
The chip manufacturing process is complex and prone to flaws, which are referred to as faults. A fault is testable
Design for Test
Electromigration in VLSI Physical Design: A Brief Guide
Electromigration in VLSI physical design is a major concern, particularly at lower technology nodes where the cross-sectional area of metal
Design for Test
Career growth for a DFT Engineer
DFT or “Design For Testability” is a technique, which facilitates a design to become testable after production. It is the
