The Key Techniques Used in Design for Testability
Without a way to easily check if everything works during the design process, finding problems later can be a nightmare. […]
5 Common Fault Models In VLSI
Gujarat Institute receives a 3.8 crore grant for VLSI research, highlighting the growing importance and investment in the field of
The Stuck-at Fault Model: Key Concept in Digital Circuit Testing
In the realm of digital circuit design and testing, the detection and diagnosis of faults play a crucial role in
Design for testability vs. functional verification
In the ever-evolving semiconductors landscape, DFT and functional verification have a huge role to play in ensuring the quality and reliability of hardware and software systems. They offer a high rate of defect detection leading to fewer faulty chips and increased confidence in the design’s functionality and performance.
Role of DFT in the Chip Life Cycle
According to a report by MMR, the VLSI semiconductor industry was worth US$ 53.93 billion in 2022, and total VLSI
Design for Test
Bridging Fault Model: Understanding and Mitigating Circuit Failures
In the realm of digital circuit design, the reliable and accurate functioning of integrated circuits (ICs) is of utmost importance.
The Importance of LBIST: Enhancing Testability in Semiconductor Design
In the present-day scenario, the design complexity and size of the SOC are expanding at an alarming rate. Designers are
Design for Test
Optimizing VLSI Design With D-Algorithm
D-algorithm is a powerful optimization technique used in VLSI design to reduce the size of circuits and improve their performance.
Design for Test
Unleashing The Power Of JTAG In Digital Circuits
JTAG or Joint Test Action Group was developed in the 1980s as a way to improve the testing and debugging
Design for Test
Burn-in Test: Everything You Need To Know
In the field of VLSI, the burn-in test is an essential and critical process used to identify any potential defects
