Steps to Diagnose Latch-Up Issues in VLSI Systems
Latch-up is a critical reliability concern in Very Large Scale Integration (VLSI) systems, which can lead to device failure and increased power consumption. Understanding how to diagnose and prevent latch-up is essential for ensuring the longevity and performance of integrated circuits (ICs). For those interested in mastering these concepts, enrolling in a VLSI course can […]
LVS in VLSI: Practical Applications to Future Implications
Imagine what happens if we don’t test a product, tool, software, etc before launch. Of course, the product may lead to failure. Similarly, when we prototype a chip, the chip needs to be tested based on different parameters else the final Integrated Circuit(IC) can be a big fail. One of the parameters to test is […]