Power Dissipation in CMOS Circuits

Low power consumption and high-density ICs are required to rapidly develop portable systems such as laptops, PDAs, digital wristwatches, mobile phones, etc. As a result, there has been an explosion of inventive research in the low-power device and VLSI design methodologies. In most situations, low power consumption needs must be balanced against the equally demanding […]

Electromigration in VLSI Physical Design: A Brief Guide

Electromigration in VLSI physical design is a major concern, particularly at lower technology nodes where the cross-sectional area of metal interconnects is relatively small. If an integrated circuit is not constructed properly, it might suffer from electromigration. The electromigration rate is influenced by various elements, and one field of reliability engineering focuses on assuring minimal […]

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